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Test methods have been shown to give statistically valid results (see Appendix 1 for anion validation)
1-0309 (technical revision)
This Test Method is applicable to silicon wafers with defect density between 0
75 R&D facilities & Pilot lines
general size
D08100 - SEMI D81 - Test Method for Dimming Properties of Flat Panel Displays StdVol-Automation Technology Test methods have been shownThe performance of the dimming technology affects the image quality of the display. Even though there are several measuring methods for display luminance, they are not enough to represent the luminance of small sizes are formed less than 10% of the active area. The new measurement methods propose to measure the luminance characteristics of dimming technology that operates according to the signal from small sizes. This Standard is applicable to the
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