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1 nm Repeatability
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Spectral Reflectance Film Thickness Measurement System thin-film margin-top:5px} /* ─── SECTION ───Spectral Reflectance Technology Precision Film Thickness Measurement Non Contact Nanometer to Micrometer Analysis High precision film thickness measurement based on advanced spectral reflectance technology. Enables accurate, non contact measurement from 5 nm to 250 m across semiconductors, photovoltaics, optical coatings, and biomedical applications. Direct replacement for Filmetrics F20 systems. Request Application Study 0. 1 nm Repeatability 5 nm
US$ 83.00
US$ 124.00
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